Wafer Measurement

      
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Tordivel Solar AS is a complete supplier of inline and offline inspection and measurement systems and components for Wafer Production.
 
The scope is to check wafers for defects and providing measurement and sorting data. This with the highest reliability and accuracy, low maintenance cost and the best total cost of ownership.

 

Our systems do these Wafer Measurements:

• Sawmarks

• TTV – Thickness

• Size, Surface, Chipping Edge Detection

• Contamination

• Detection and Identification

• Microcrystal Detection

 

The Sawmarks Measurement System measures wafers using a patent pending and unique shadow measurement technique, cancelling the effects of the crystal pattern. The operator can verify how the sawmarks develop over the wafer. Large sawmarks will often have a large gradient towards the edge of the wafer.

 

We are proud to present a combined Sawmarks and TTV Measurement System with a resolution of 1 micrometer. 

 

The solutions are built on Scorpion Vision Software for user friendliness, configurability, reliability, flexibility and ease of maintenance. Off-the-shelf world class hardware components including area- and line-scan camera technology are used.